Thin Film Flow and Thermal Fluctuations
This research investigates the stability and dynamics of thin liquid films under the influence of thermal fluctuations. We employ the stochastic lubrication equation (SLE) to model the interplay between capillary forces, viscous forces, and thermal noise at the nanoscale.
Key Findings
Our numerical simulations reveal that thermal fluctuations can significantly affect the rupture behavior of ultra-thin films, with implications for coating processes and microfluidic device design.

